Pendant group orientation of poly(2-vinylnaphthalene) thin film surface studied by near-edge x-ray absorption fine structure spectroscopy (NEXAFS) and angle-resolved ultraviolet photoelectron spectroscopy (ARUPS)

Angle-resolved ultraviolet photoelectron spectroscopy (ARUPS) and near-edge x-ray absorption fine structure (NEXAFS) spectroscopy were applied to the investigation of the tilt angles of the naphthalene pendant groups at the s urface of a poly(2-vinylnaphthalene) thin film. In contrast to NEXAFS, whic h provides only an average determination of the tilt angle, ARUPS combined with a sophisticated analysis of photoelectron angular dependence offers mo re detailed information. It was concluded that the naphthalene pendant grou ps are tilted randomly at the polymer surface, and that the tilt angle dist ribution is well described as a three-dimensional isotropic random orientat ion. (C) 2000 American Institute of Physics. [S0021-9606(00)70723-9].