Structural stability of solid deuterium films

Citation
L. Fleischmann et al., Structural stability of solid deuterium films, J L TEMP PH, 119(5-6), 2000, pp. 615-625
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF LOW TEMPERATURE PHYSICS
ISSN journal
00222291 → ACNP
Volume
119
Issue
5-6
Year of publication
2000
Pages
615 - 625
Database
ISI
SICI code
0022-2291(200006)119:5-6<615:SSOSDF>2.0.ZU;2-A
Abstract
The wetting behavior of quenched-condensed solid D-2 films has been investi gated by means of light scattering. On the substrates used here (graphite a nd aluminum) molecular deuterium displays triple point wetting and hence de wets in the solid state, provided the temperature is high enough that therm ally activated diffusion process can take place. This manifests itself in a coarse-graining of the D-2 film. In order to avoid this process and to obt ain complete wetting of solid D-2 we have modified the adsorbate-substrate interaction potential by preplanting the substrates with thin inert layers of Ne, Ar, CH4 or C2H6. The predicted change in the wetting properties was not observed, however, suggesting that the exisiting picture of triple poin t wetting of van der Walls system is not complete. The implications of thes e results for a neutrino mass experiment where quenched-condensed molecular tritium films are used as a source are discussed.