The interactions of hyperthermal chlorotitanium ions, TiCx+ (x = 0-4) with
HOPG surfaces were studied by low-energy ion scattering of TiClx+ from HOPG
and by XPS depth profile analysis of the TiClx+ exposed HOPG surfaces. Pos
itive ion scattering data for 5-500 eV collision energies showed exclusivel
y dissociative scattering of the molecular TiClx+ into TiCl+ and Ti+ fragme
nts. TiCl3+ and TiCl2+ daughter fragments were not detected in the surface-
induced dissociation (SID) spectra of the corresponding larger incident TiC
lx+ ions. The observed survival of > 100 eV TiCl3+ and TiCl2+ incident ions
in the scattered ion spectra and the calculated trend in the electron affi
nities of TiClx neutrals implicate the role of bond dissociation in the eff
icient electron transfer to the departing TiCl3 and TiCl2 fragments during
SID. XPS depth profile analysis showed a good correlation between the colli
sion energy and the type of incident TiClx+ with the quality of TiC thin fi
lms formed on the surface of HOPG. Higher collision energies resulted in hi
gher carbidic C to Ti ratios and higher carbidization efficiencies whereas
a larger number of Cl atoms in the incident TiClx+ ion gave lower stoichiom
etries and lower carbidization efficiencies in the resulting films.