A new compact physical submicron MOSFET model for circuit simulation

Citation
Aa. Ati et al., A new compact physical submicron MOSFET model for circuit simulation, MICROEL ENG, 51-2, 2000, pp. 373-392
Citations number
18
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONIC ENGINEERING
ISSN journal
01679317 → ACNP
Volume
51-2
Year of publication
2000
Pages
373 - 392
Database
ISI
SICI code
0167-9317(200005)51-2:<373:ANCPSM>2.0.ZU;2-L
Abstract
This paper presents a new compact and physics-based submicron MOSFET model suitable for circuit simulation. It takes into account the major physical e ffects in state-of-the-art deep-submicron MOSFET devices. Moreover, it uses only 15 model parameters and ensures the continuity of the drain current, output conductance, transconductance, terminal charges and capacitances at the various operating region boundaries. The accuracy of the new model is v erified by comparison with experimental data for MOSFETs with different dim ensions. Furthermore, it passes a set of benchmark tests for different appl ications. The new model has been implemented in Microwind2 PC-based design tool. (C) 2000 Elsevier Science B.V. All rights reserved.