Authors
Citation
B. Garrido et Jr. Morante, Special issue - Dielectrics in microelectronics, MICROEL REL, 40(4-5), 2000, pp. 555-555
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714
→ ACNP
Volume
40
Issue
4-5
Year of publication
2000
Pages
555 - 555
Database
ISI
SICI code
0026-2714(200004/05)40:4-5<555:SI-DIM>2.0.ZU;2-7