Flicker noise spectroscopy - a new method of studying non-stationary effects in electrical conductivity of oxides

Citation
V. Parkhutik et al., Flicker noise spectroscopy - a new method of studying non-stationary effects in electrical conductivity of oxides, MICROEL REL, 40(4-5), 2000, pp. 601-604
Citations number
3
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
40
Issue
4-5
Year of publication
2000
Pages
601 - 604
Database
ISI
SICI code
0026-2714(200004/05)40:4-5<601:FNS-AN>2.0.ZU;2-4
Abstract
This work shows the possibilities of the application of a new phenomenologi cal approach known as flicker noise spectroscopy (FNS) in studying the non- equilibrium effects in d.c, and a.c, electrical conductivities of oxides (l ocal phase transitions under the influence of high electric fields and loca l heating effects, generation of space charges, memory effects, pre-breakdo wn instabilities, influence of environment, etc.). The FNS method is very informative in describing dynamic effects, which ass ist the electrical current flow through thin (20-60 nm) oxide films formed at the Si surface by its electrochemical oxidation. Polarity of the voltage applied to the structure and polarization history (whether the voltage inc reases or decreases) essentially influence the electrical noise, first of a ll, a degree of dynamic memory in a sequence of individual bursts contribut e to the noise signal. (C) 2000 Elsevier Science Ltd. All rights reserved.