Effect of implantation and annealing conditions on the photoluminescence emission of Si nanocrystals ion beam synthesised in SiO2

Citation
M. Lopez et al., Effect of implantation and annealing conditions on the photoluminescence emission of Si nanocrystals ion beam synthesised in SiO2, MICROEL REL, 40(4-5), 2000, pp. 859-862
Citations number
12
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
40
Issue
4-5
Year of publication
2000
Pages
859 - 862
Database
ISI
SICI code
0026-2714(200004/05)40:4-5<859:EOIAAC>2.0.ZU;2-O
Abstract
In this article, we present a systematic study of the evolution of photolum inescence (PL) emission of Si nanocrystals with elaboration conditions. Si nanocrystals synthesised in SiO2 by ion implantation and annealing at 1100 degrees C show a wide (0.3 eV) and a very intense PL emission centred at 1. 5-1.7 eV, linked to the presence of the nanocrystals. The intensity of this emission shows a typical behaviour with the annealing time, with a fast tr ansitory increase to reach an asymptotical saturation. There is a linear in crease of the PL intensity at saturation with the dose. Two regimes are cle arly observed for the evolution of the PL energy position as a function of the annealing time for different peak supersaturations (s): (i) for s < 5%, there is a decrease transient followed by a saturation state of the maximu m peak energy, and (ii) for s greater than or equal to 5% the PL energy pre sents an increase transient followed by a saturation state. (C) 2000 Elsevi er Science Ltd. All rights reserved.