A novel procedure is proposed for the deposition of Si/SiO2 multilayers by
magnetron sputtering of an SiO2 target under a hydrogen-rich plasma. The ef
fect of increasing hydrogen pressure (PH) was investigated For the case of
a monolayer. This involved an increased enrichment in the Si of the deposit
ed film, because of the incorporation deficit of oxygen that is efficiently
"reduced" by hydrogen. This was found to favour the formation of Si crysta
llites, together with a significant improvement of the phase segregation be
tween Si grains and silica. The increase of the deposition temperature (T-S
) induced similar effects in such a way that the layer obtained with high P
-H and T-S behaves as a pure silicon film with a refractive index close to
3.2. Thus, a 40-period Si-rich/silica multilayered system was fabricated by
alternating the introduction and the switching off of the hydrogen flux. T
he related electron microscopy image showed evidence of good quality multil
ayers, which attests the reliability of the new method. (C) 2000 Elsevier S
cience Ltd. All rights reserved.