Transport of oxygen atoms mediated by electronic excitation

Citation
Dk. Avasthi et al., Transport of oxygen atoms mediated by electronic excitation, NUCL INST B, 166, 2000, pp. 345-349
Citations number
18
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
166
Year of publication
2000
Pages
345 - 349
Database
ISI
SICI code
0168-583X(200005)166:<345:TOOAMB>2.0.ZU;2-O
Abstract
Diffusion of oxygen from substrate to the film was observed under the influ ence of large electronic excitation. CuO thin film similar to 210 nm on flo at glass was irradiated with 210 MeV I ions. We noticed the transport of ox ygen from the substrate to the CuO him through the interface. The amount of oxygen transport From glass to the film was found to be fluence dependent. The loss of oxygen from the films was also observed. The erosion of Cu ato ms was also observed beyond a fluence of 9.6 x 10(13) ions/cm(2). The measu rements were performed by on-line elastic recoil detection using a large ar ea position sensitive detector. Since the electronic energy loss dominates in the present case of 210 MeV I ions, the observed changes at the interfac e and surface are attributed to inelastic collisions of the incident ions w ith the atomic electrons in the sample. (C) 2000 Elsevier Science B.V. All rights reserved.