Method of the ratio of envelopes of the reflection spectrum for measuring optical constants and thickness of thin films

A spectrophotometric method is proposed that uses the ratio of envelopes of minima and maxima of the interference reflection spectrum for measuring op tical constants of a film on a substrate. Because this ratio does not conta in the instrumental function of a spectrophotometer, there is no need in ca reful calibration of the spectrophotometer. In the case of a transparent is otropic film on an absorbing substrate, the inverse problem has an analytic solution. A simple method is proposed for numerical calculations of the op tical constants and thickness of an absorbing film. (C) 2000 MAIK "Nauka/In terperiodica".