Frustration-induced glass behavior in solid N-2? Audio frequency dielectric measurements

Citation
S. Pilla et al., Frustration-induced glass behavior in solid N-2? Audio frequency dielectric measurements, PHYSICA B, 284, 2000, pp. 1125-1126
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
284
Year of publication
2000
Part
2
Pages
1125 - 1126
Database
ISI
SICI code
0921-4526(200007)284:<1125:FGBISN>2.0.ZU;2-N
Abstract
High-sensitivity dielectric constant measurements of solid N-2 in the audio frequency range have revealed the existence of strong unexpected hysteresi s in the high-temperature HCP phase above an onset temperature T-h = 42 K, We report a sharp kink at T-h, observed only when the sample is annealed at 41.5 < T < 43 K for 6-8 h, suggesting that the thermal processes in this w indow of temperature are rather slow. We argue that the results are consist ent with the breakdown of orientational ordering at Th and the onset of fru stration-induced orientational glass states in the absence of site disorder above T-h. (C) 2000 Elsevier Science B.V. All rights reserved.