FIR photovoltaic effect in a boron-doped silicon structure

Citation
Dy. Kovalev et al., FIR photovoltaic effect in a boron-doped silicon structure, PHYSICA B, 284, 2000, pp. 1183-1184
Citations number
2
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
284
Year of publication
2000
Part
2
Pages
1183 - 1184
Database
ISI
SICI code
0921-4526(200007)284:<1183:FPEIAB>2.0.ZU;2-V
Abstract
A new FIR photovoltaic effect, which does not depend on incident radiation intensity, is found at low temperatures in modulated unipolar boron-doped s ilicon structure. It is shown that the effect originates from an asymmetric ballistic hole transport across the low doped layer due to fast trapping p rocess within the upper Hubbard impurity band of the doped layer. The analy sis of the temperature dependence of the photovoltage gives the Fermi energ y in the impurity band. (C) 2000 Published by Elsevier Science B.V. All rig hts reserved.