Citation
R. Zuberek et al., Thickness dependence of cubic anisotropy constant in sputtered Fe films onGaAs substrates, PHYSICA B, 284, 2000, pp. 1237-1238
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526
→ ACNP
Volume
284
Year of publication
2000
Part
2
Pages
1237 - 1238
Database
ISI
SICI code
0921-4526(200007)284:<1237:TDOCAC>2.0.ZU;2-V
Abstract
Low-temperature properties of thin iron films prepared by DC magnetron sput
tering on single-crystal GaAs (001) substrates have been investigated by me
ans of FMR measurements. It was found in the presence of both the fourfold
and twofold anisotropy. Both of them depend strongly on the thickness of th
e film. It means that the surface anisotropy determines not only the value
of the twofold anisotropy but also the fourfold one. (C) 2000 Elsevier Scie
nce B.V. All rights reserved.