Tunneling characteristics of I- and HgI2-intercalated Bi2Sr2CaCu2O8+x single crystals

Authors
Lee, M Chang, HS Doh, YJ Lee, HJ Lee, W Choy, JH Ha, DH
Citation
M. Lee et al., Tunneling characteristics of I- and HgI2-intercalated Bi2Sr2CaCu2O8+x single crystals, PHYSICA B, 284, 2000, pp. 1844-1845
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
284
Year of publication
2000
Part
2
Pages
1844 - 1845
Database
ISI
SICI code
0921-4526(200007)284:<1844:TCOIAH>2.0.ZU;2-W
Abstract
We compared c-axis tunneling characteristics of small stacked intrinsic Jos ephson junctions prepared on the surface of pristine, I-, and HgI2-intercal ated Bi2Sr2CaCu2Oy (Bi2212) single crystals. Relation between the interlaye r coupling and the in-plane gap, estimated from I-V characteristics, seems to contradict to the interlayer pair tunneling mechanism of high-T-c superc onductivity. (C) 2000 Elsevier Science B.V. All rights reserved.