Low-temperature transport measurements on superconducting film - normal met
al wire - superconducting film (SNS) junctions fabricated on the basis of 6
nm thick superconducting polycrystalline PtSi films are reported. The stru
ctures with the normal metal wires of two different lengths L = 1.5 and 6 u
m and the same widths W = 0.3 mu m are studied. The zero bias resistance di
p is observed for all junctions whereas the subharmonic energy gap structur
e (SGS) originating from multiple Andreev reflections occurs only in the SN
S junctions with short wires. (C) 2000 Elsevier Science B.V. All rights res
erved.