Reentrance of conductance in mesoscopic normal-metal/superconductor junctions

Authors
Kim, N Lee, H Chang, HS Kim, JJ Lee, JO Park, JW Yoo, KH
Citation
N. Kim et al., Reentrance of conductance in mesoscopic normal-metal/superconductor junctions, PHYSICA B, 284, 2000, pp. 1866-1867
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
284
Year of publication
2000
Part
2
Pages
1866 - 1867
Database
ISI
SICI code
0921-4526(200007)284:<1866:ROCIMN>2.0.ZU;2-9
Abstract
Two different kinds of mesoscopic N-S-N junctions were fabricated by sandwi ching Al or Pb film between two closely separated Au wires. dV/dI versus V curves for an Au-Pb-Au junction show a sharp zero-bias dip, while those for an Au-Al-Au show a reentrant zero-bias maximum. Interference between conju gate electrons and holes at an interface with different degree of transpare ncy is responsible for the contrasting behavior. (C) 2000 Elsevier Science B.V. All rights reserved.