RHEED intensity oscillations in homoepitaxial growth of SrTiO3 films

Authors
Lee, JY Juang, JY Ou, JH Chen, YF Wu, KH Uen, TM Gou, YS
Citation
Jy. Lee et al., RHEED intensity oscillations in homoepitaxial growth of SrTiO3 films, PHYSICA B, 284, 2000, pp. 2099-2100
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
284
Year of publication
2000
Part
2
Pages
2099 - 2100
Database
ISI
SICI code
0921-4526(200007)284:<2099:RIOIHG>2.0.ZU;2-Y
Abstract
The amplitude and periodicity of the reflection high-energy electron diffra ction (RHEED) oscillations displayed strong temperature dependence in homoe pitaxy of SrTiO3(STO) films. Combining with the AFM observations, the resul ts suggest that the oscillations are not directly related to the layer-by-l ayer growth. (C) 2000 Elsevier Science B.V. All rights reserved.