We have measured the rate of thermally, assisted magnetization reversal of
submicron-sized magnetic thin films. For fields H just less than the zero-t
emperature switching field H-C, the probability of reversal, p(s)(exp) (t),
increases for short times t, achieves a maximum value, and then decreases
exponentially. Micromagnetic simulations exhibit the same behavior and show
that the reversal proceeds through the annihilation of two domain walls th
at move from opposite sides of the sample. The behavior of P-s(exp) (t) can
be understood through a simple "energy-ladder" model of thermal activation
.