Activation energies in organic light emitting diodes comprising ohmic contacts both for electron and hole injection

Citation
J. Staudigel et al., Activation energies in organic light emitting diodes comprising ohmic contacts both for electron and hole injection, SYNTH METAL, 111, 2000, pp. 69-73
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SYNTHETIC METALS
ISSN journal
03796779 → ACNP
Volume
111
Year of publication
2000
Pages
69 - 73
Database
ISI
SICI code
0379-6779(20000601)111:<69:AEIOLE>2.0.ZU;2-H
Abstract
The lowest obtainable operating voltage for organic light emitting diodes ( OLEDs) utilising a predefined organic layer setup can only be achieved with ohmic contacts both for electron and hole injection. We have investigated dark current transients of unipolar single-layer samples, and we have found ohmic contacts both for hole injection at indium tin oxide (ITO)/4,4',4"-t ris(N-(1-naphtyl)-N-phenylamino)- triphenylamine (1-Naphdata) interfaces an d for electron injection at 8-hydroxyquinoline aluminum (Alq(3))/LiF/Al int erfaces. Therefore, the properties of OLEDs comprising these two interfaces are governed only by bulk material properties and internal organic/organic interfaces. In order to identify the dominating mechanisms concerning the temperature-dependent behaviour of prototypical double layer OLEDs, we have measured (with respect to the applied electric field) the activation energ ies of the charge carrier mobility and of the steady state current density in 1-Naphdata (holes) and Alq(3) (electrons), the activation energies of th e steady state current density and of the luminance in OLEDs comprising an 1-Naphdata/Alq(3) heterojunction, plus the activation energy of the luminan ce onset. These experimentally activation energies are discussed with respe ct to device performance in the typical operating temperature range of flat panel displays including implications for further device optimisation. (C) 2000 Published by Elsevier Science S.A. All rights reserved.