Current-voltage characteristics of single and hetero-layer light-emitting d
evices with an aromatic diamine (TPD) as hole transport material and tris-8
-(hydroxyquinoline) aluminum (Alq(3)) as electron transport material and em
itter have been investigated over a wide temperature range and for various
film thickness in order to identify the Limiting mechanism: charge carrier
transport or injection. From the observed thickness and temperature depende
nce, pure injection limitation can be ruled out as dominant mechanism. Inst
ead, the voltage dependence of the current density can be well described by
power laws j proportional to Vm + 1 (with V corrected by the built-in pote
ntial) with temperature dependent exponents m ranging from 4 to 25. This ca
n be interpreted in terms of space charge limited currents (SCLC) in Alq(3)
with an exponential energetic distribution of traps where m is given by m
= E-t/kT. A reasonable trap energy of 0.15-0.2 eV is obtained by a temperat
ure dependent analysis of the I-V characteristics. However, the thickness d
ependence cannot be satisfactorily explained by the simple SCLC-model. This
indicates that more sophisticated models are required. (C) 2000 Elsevier S
cience S.A. All rights reserved.