Simulation of the stepped surface of a high-resolution X-ray diffractor

Three possible schemes of a high-resolution stepped X-ray diffractor have b een analyzed, including those based on the steps of equal angular widths, t he steps of equal heights (i.e., distances from the step edge to the beginn ing of the next step), and the symmetric steps (where a distance from the s tep edge to the focusing circumference is equal to the distance from the fo cusing circumference to the edge of the next step). It is shown that the fi rst and the third schemes provide most stable characteristics. (C) 2000 MAI K "Nauka/Interperiodica".