Epitaxial ZnSe films were grown by metal organic chemical vapor deposition
(MOCVD) method assisted with hydrogen radicals generated by hollow cathode
plasma. The amount of hydrogen (H) radicals generated in a hollow cathode p
lasma (HCP) was twice than that in an inductively coupled plasma (ICP), whi
ch was measured by NO2 gas titration technique. The growth rate of the ZnSe
film was increased by a factor of three when H-radicals generated by a r.f
.-ICP are introduced into the substrate region. On the other hand, the grow
th rate was increased by a factor of ten using H-radicals generated by HCP
in comparison with normal growth without using H-radicals. The Xray diffrac
tion studies showed the quality of ZnSe films grown by HCP was almost same
to the films grown by ICP. The HCP is very useful H-radical generator for a
radical assisted MOCVD growth. (C) 2000 Elsevier Science S.A. All rights r
eserved.