ZnSe growth by radical assisted MOCVD using hollow cathode plasma

Citation
T. Aoki et al., ZnSe growth by radical assisted MOCVD using hollow cathode plasma, THIN SOL FI, 368(2), 2000, pp. 244-248
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
368
Issue
2
Year of publication
2000
Pages
244 - 248
Database
ISI
SICI code
0040-6090(20000615)368:2<244:ZGBRAM>2.0.ZU;2-G
Abstract
Epitaxial ZnSe films were grown by metal organic chemical vapor deposition (MOCVD) method assisted with hydrogen radicals generated by hollow cathode plasma. The amount of hydrogen (H) radicals generated in a hollow cathode p lasma (HCP) was twice than that in an inductively coupled plasma (ICP), whi ch was measured by NO2 gas titration technique. The growth rate of the ZnSe film was increased by a factor of three when H-radicals generated by a r.f .-ICP are introduced into the substrate region. On the other hand, the grow th rate was increased by a factor of ten using H-radicals generated by HCP in comparison with normal growth without using H-radicals. The Xray diffrac tion studies showed the quality of ZnSe films grown by HCP was almost same to the films grown by ICP. The HCP is very useful H-radical generator for a radical assisted MOCVD growth. (C) 2000 Elsevier Science S.A. All rights r eserved.