Molecular layer epitaxy

Citation
J. Nishizawa et T. Kurabayashi, Molecular layer epitaxy, THIN SOL FI, 367(1-2), 2000, pp. 13-24
Citations number
33
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
367
Issue
1-2
Year of publication
2000
Pages
13 - 24
Database
ISI
SICI code
0040-6090(20000515)367:1-2<13:MLE>2.0.ZU;2-0
Abstract
Molecular layer epitaxy (MLE) of GaAs related compounds and Si with SiO2 de position has been developed to realize the tera-hertz operating devices. At sufficiently low process temperature, lower than in the conventional growt h method, device quality epitaxial layers were achieved by MLE. In GaAs, 10 0 Angstrom scale static induction transistors are fabricated with MLE. Thes e transistors operated in a mixed ballistic-tunneling mode or in the pure t unneling mode. Basic research on MLE in the field of surface science and ma terial science is performed, from the point of view of device application o f this technology. (C) 2000 Elsevier Science S.A. All rights reserved.