Citation
R. Diduszko et al., Influence of Mn content in MBE-grown Sn1-xMnxTe layers on their structuralproperties studied by X-ray diffraction, THIN SOL FI, 367(1-2), 2000, pp. 168-170
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090
→ ACNP
Volume
367
Issue
1-2
Year of publication
2000
Pages
168 - 170
Database
ISI
SICI code
0040-6090(20000515)367:1-2<168:IOMCIM>2.0.ZU;2-U
Abstract
This work presents the results of X-ray diffractometric measurements perfor
med on Sn1-xMnxTe heteroepitaxial layers grown using the molecular beam epi
taxy (MBE) technique. The examinations included measurements of lattice con
stants, orientation, width of peak profiles and trace phases versus Mn cont
ent. (C) 2000 Elsevier Science S.A. All rights reserved.