Reflectance difference spectroscopy: a powerful tool for in situ investigations of II-VI compounds with Mn

Citation
A. Bonanni et al., Reflectance difference spectroscopy: a powerful tool for in situ investigations of II-VI compounds with Mn, THIN SOL FI, 367(1-2), 2000, pp. 216-219
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
367
Issue
1-2
Year of publication
2000
Pages
216 - 219
Database
ISI
SICI code
0040-6090(20000515)367:1-2<216:RDSAPT>2.0.ZU;2-5
Abstract
Reflectance difference spectroscopy (RDS) was employed for in situ investig ation during and upon the molecular beam epitaxy of II-VI compounds with Mn . In heavily p-doped ZnMnTe:N, at low content of magnetic ions and at growt h temperature it was possible to observe below and in the band gap region f eatures occurring from intra-Mn transitions. Furthermore, the overgrowth of Mn islands with mismatched materials was investigated. Reproducibility in size and shape of Mn-based nanostructures was achieved by tracing the forma tion process via RDS. (C) 2000 Elsevier Science S.A. All rights reserved.