In situ transmission electron microscopy study of electric-field-induced microcracking in single crystal Pb(Mg1/3Nb2/3)O-3-PbTiO3

Authors
Xu, Z Tan, X Han, P Shang, JK
Citation
Z. Xu et al., In situ transmission electron microscopy study of electric-field-induced microcracking in single crystal Pb(Mg1/3Nb2/3)O-3-PbTiO3, APPL PHYS L, 76(25), 2000, pp. 3732-3734
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
25
Year of publication
2000
Pages
3732 - 3734
Database
ISI
SICI code
0003-6951(20000619)76:25<3732:ISTEMS>2.0.ZU;2-K
Abstract
In this letter, we report in situ transmission electron microscopy (TEM) st udy of effect of a cyclic electric field on microcracking in a single cryst al piezoelectric 0.66Pb(Mg1/3Nb2/3)O-3-0.34PbTiO(3). A TEM heating stage wa s modified to permit the in situ application of an electric field on the TE M sample surface. Microcrack initiation from a fine pore under an applied c yclic electric field was directly observed in the piezoelectric single crys tal. Experimental procedures for in situ TEM studies were described. (C) 20 00 American Institute of Physics. [S0003-6951(00)05125-1].