Regimented placement of self-assembled Ge dots on selectively grown Si mesas

Citation
G. Jin et al., Regimented placement of self-assembled Ge dots on selectively grown Si mesas, APPL PHYS L, 76(24), 2000, pp. 3591-3593
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
24
Year of publication
2000
Pages
3591 - 3593
Database
ISI
SICI code
0003-6951(20000612)76:24<3591:RPOSGD>2.0.ZU;2-6
Abstract
The control of positioning of self-assembled dots is critical for the fabri cation of regimented arrays in signal processing applications. We report th e controllable positioning of self-assembled Ge dots using selectively grow n Si mesas as a template. The dependence of the dot arrangement on growth t emperature and Ge thickness has been investigated. The experimental results show ability to control the positioning of Ge dots based on energetically preferential nucleation. The Ge dot growth on Si mesas is demonstrated to b e a promising way to realize the placement of regimented arrays of self-ass embled dots and even a single dot. This technique can be extended to other heterostructure growths. (C) 2000 American Institute of Physics. [S0003-695 1(00)04124-3].