Alternating current Josephson effect in intrinsic Josephson bridges in Tl2Ba2CaCu2O8 thin films

Citation
Os. Chana et al., Alternating current Josephson effect in intrinsic Josephson bridges in Tl2Ba2CaCu2O8 thin films, APPL PHYS L, 76(24), 2000, pp. 3603-3605
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
24
Year of publication
2000
Pages
3603 - 3605
Database
ISI
SICI code
0003-6951(20000612)76:24<3603:ACJEII>2.0.ZU;2-5
Abstract
We have performed transport measurements on bridges patterned in misaligned thin films of the superconductor Tl2Ba2CaCu2O8. There is a c-axis componen t of current flow along the bridge, giving rise to hysteretic Josephson-lik e current-voltage curves. The temperature dependence of the critical curren t follows the Ambegaokar-Baratoff theory with IcRN up to 26 mV at 4.2 K. Mi crowave emission from the Josephson junctions near T-c (approximate to 103 K) has been detected using an X-band detector. We show that 700 +/- 15 junc tions in the bridge are actively oscillating, confirming that the junctions are "intrinsic" junctions formed by adjacent copper oxide planes in the Tl 2Ba2CaCu2O8 crystal structure. (C) 2000 American Institute of Physics. [S00 03-6951(00)04924-X].