Double fitting of Maker fringes to characterize near-surface and bulk second-order nonlinearities in poled silica

Citation
Mx. Qiu et al., Double fitting of Maker fringes to characterize near-surface and bulk second-order nonlinearities in poled silica, APPL PHYS L, 76(23), 2000, pp. 3346-3348
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
23
Year of publication
2000
Pages
3346 - 3348
Database
ISI
SICI code
0003-6951(20000605)76:23<3346:DFOMFT>2.0.ZU;2-S
Abstract
An experimental analysis of the distribution and thickness of the bulk nonl inearity induced in poled silica is reported. The second-order susceptibili ty decreases exponentially from the anodic interface. Maker fringe patterns showing a double structure are interpreted in relation to the presence of two nonlinear profiles. one concentrated near the anodic surface and anothe r extending into the bulk of the sample. The Maker fringe theory is properl y generalized and a double fitting technique reproducing well the experimen tal results is used to characterize the induced nonlinearities. The depende nce of the second-harmonic signal on the poling temperature is given, which is different from that of sol-gel silica. (C) 2000 American Institute of P hysics. [S9003-6951(00)02923-5].