Mx. Qiu et al., Double fitting of Maker fringes to characterize near-surface and bulk second-order nonlinearities in poled silica, APPL PHYS L, 76(23), 2000, pp. 3346-3348
An experimental analysis of the distribution and thickness of the bulk nonl
inearity induced in poled silica is reported. The second-order susceptibili
ty decreases exponentially from the anodic interface. Maker fringe patterns
showing a double structure are interpreted in relation to the presence of
two nonlinear profiles. one concentrated near the anodic surface and anothe
r extending into the bulk of the sample. The Maker fringe theory is properl
y generalized and a double fitting technique reproducing well the experimen
tal results is used to characterize the induced nonlinearities. The depende
nce of the second-harmonic signal on the poling temperature is given, which
is different from that of sol-gel silica. (C) 2000 American Institute of P
hysics. [S9003-6951(00)02923-5].