Origin of preferential orthorhombic twinning in SrRuO3 epitaxial thin firms

In order to elucidate the driving forces which promote oriented in-plane cr ystallographic texture: in SrRuO3 thin films deposited on stepped SrTiO3 su bstrates, a high-temperature x-ray analysis of both SrRuO3 thin films and p owders was conducted. Structural phase transitions were found at temperatur es near 350 degrees C and slightly above 600 degrees C. The transitions are tentatively indexed as orthorhombic to tetragonal and tetragonal to cubic, respectively. These results suggest that SrBuO3 thin films grow with cubic symmetry. As such, Aim-substrate interfacial characteristics, rather than a preferred growth direction, are believed to determine the orientation of orthorhombic twins. (C) 2000 American Institute of Physics. [S0003-6951(00) 00423-X].