The Meyer-Neldel rule in organic thin-film transistors

Citation
Ej. Meijer et al., The Meyer-Neldel rule in organic thin-film transistors, APPL PHYS L, 76(23), 2000, pp. 3433-3435
Citations number
37
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
23
Year of publication
2000
Pages
3433 - 3435
Database
ISI
SICI code
0003-6951(20000605)76:23<3433:TMRIOT>2.0.ZU;2-X
Abstract
We have measured and analyzed the temperature and gate voltage dependencies of the field-effect mobility in organic thin-film transistors. We find tha t the mobility prefactor increases exponentially with the activation energy in agreement with the Meyer-Neldel rule. This behavior is demonstrated in the mobility data of solution-processed pentacene, poly(2,5-thienylene viny lene) and in mobility data reported in literature. Surprisingly, the charac teristic Meyer-Neldel energy for all analyzed. materials is close to 40 meV . Possible implications for the charge transport mechanism in these materia ls are discussed. (C) 2000 American Institute of Physics. [S0003-6951(00)02 323-8].