From N isoelectronic impurities to N-induced bands in the GaNxAs1-x alloy

Citation
Pj. Klar et al., From N isoelectronic impurities to N-induced bands in the GaNxAs1-x alloy, APPL PHYS L, 76(23), 2000, pp. 3439-3441
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
23
Year of publication
2000
Pages
3439 - 3441
Database
ISI
SICI code
0003-6951(20000605)76:23<3439:FNIITN>2.0.ZU;2-N
Abstract
GaNxAs1-x samples with x<3% grown by metalorganic vapor phase epitaxy were studied by low-temperature photoluminescence under hydrostatic pressure and photomodulated reflectance spectroscopy. The transformation from N acting as an isoelectronic impurity to N-induced band formation takes place at x a pproximate to 0.2%. The N level does not shift with respect to the valence band edge of GaNxAs1-x. Concentration as well as hydrostatic-pressure depen dence of the GaNxAs1-x bands can be described by a three band kp descriptio n of the conduction band state E- and E+ and the valence band at k = 0. The model parameters for T<20 and T = 300 K were determined by fitting the mod el to the experimental data. Modeling the linewidth of the E- transition by combining the kp model and ion statistics leads to the conclusion that the electron-hole pairs are strongly localized. (C) 2000 American Institute of Physics. [S0003-6951(00)02423-2].