Anticompton spectrometer element studies

Authors
Riedel, T Hentig, RV Feilitzsch, FV
Citation
T. Riedel et al., Anticompton spectrometer element studies, APPL RAD IS, 53(1-2), 2000, pp. 231-236
Citations number
4
Categorie Soggetti
Multidisciplinary
Journal title
APPLIED RADIATION AND ISOTOPES
ISSN journal
09698043 → ACNP
Volume
53
Issue
1-2
Year of publication
2000
Pages
231 - 236
Database
ISI
SICI code
0969-8043(200007/08)53:1-2<231:ASES>2.0.ZU;2-B
Abstract
Sensitive measurements of the trace elements require the use of an active s uppression of the overall detection background. For this reason, an anticom pton system made of NaI and HPGe has been constructed at the new undergroun d laboratory in Garching near Munich for analysis of irradiated samples. Si gnificantly improved limits for trace elements' concentration in nylon have been obtained. A suppression factor of 16 in the energy region of 100-400 keV was reached. (C) 2000 Elsevier Science Ltd. All rights reserved.