Extending an in situ scanning tunneling microscopic study to rough electrode surfaces - iodine adsorption at silver electrodes

Citation
Ch. Shi et al., Extending an in situ scanning tunneling microscopic study to rough electrode surfaces - iodine adsorption at silver electrodes, APPL SURF S, 158(1-2), 2000, pp. 11-15
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
158
Issue
1-2
Year of publication
2000
Pages
11 - 15
Database
ISI
SICI code
0169-4332(200005)158:1-2<11:EAISST>2.0.ZU;2-A
Abstract
We demonstrate some unique properties of a rough silver electrode surface r evealed by the atomic-resolution electrochemical scanning tunneling microsc opy (ECSTM) measurements. Taking the well-known system of iodine adsorption , we observed distinctly different iodine adlayer structures and surface di ffusion behavior on mechanically polished polycrystalline silver electrodes in comparison with those on single-crystal electrodes. The results indicat e the need to extend atomic-resolution STM studies to rough surfaces of pra ctical importance. (C) 2000 Published by Elsevier Science B.V. All rights r eserved.