Structure and morphology of the indium hydroxy sulphide thin films

Citation
R. Bayon et J. Herrero, Structure and morphology of the indium hydroxy sulphide thin films, APPL SURF S, 158(1-2), 2000, pp. 49-57
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
158
Issue
1-2
Year of publication
2000
Pages
49 - 57
Database
ISI
SICI code
0169-4332(200005)158:1-2<49:SAMOTI>2.0.ZU;2-J
Abstract
We have investigated the structure and surface morphology of chemical-bath- deposited (CBD) indium hydroxy sulphide thin Film using InCl3, thioacetamid e (Tn) and acetic acid (AcOH). We have found that films are polycrystalline and their structure depends on deposition conditions. When low TA and AcOH concentrations are used, In5S4 is obtained; nevertheless, as these concent rations are increased, films are composed by a mixture of the cubic alpha- and beta-In2S3 phases. The film composition obtained by energy-dispersive X -ray analysis (EDS) shows that samples are sulphur deficient (S/In ratios b etween 0.5 and 1.2). The surface morphology of the films suggests two diffe rent growth mechanisms. Which one takes place seems to be related to reacta nt concentrations, especially to AcOH concentration. (C) 2000 Elsevier Scie nce B.V. All rights reserved.