The photocurrent dark decay in photorefractive materials is theoretically a
nalyzed by using two different dynamical approaches-namely, the shallow tra
ps and electron-hole transport models. The analysis is based on experimenta
l results that show a double exponential decay of the photocurrent with sho
rt pulsed or continuous excitation. Expressions for the photocurrent amplit
udes and decay times have been derived in terms of material and excitation
parameters. Several dynamic behaviors are predicted for both models.