The DELPHI Silicon Tracker in the global pattern recognition

Authors
Citation
M. Elsing, The DELPHI Silicon Tracker in the global pattern recognition, NUCL INST A, 447(1-2), 2000, pp. 76-89
Citations number
20
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
447
Issue
1-2
Year of publication
2000
Pages
76 - 89
Database
ISI
SICI code
0168-9002(20000601)447:1-2<76:TDSTIT>2.0.ZU;2-N
Abstract
ALEPH and DELPHI were the first experiments operating a silicon vertex dete ctor at LEP. During the past 10 years of data taking the DELPHI Silicon Tra cker was upgraded three times to follow the different tracking requirements for LEP 1 and LEP 3 as well as to improve the tracking performance. Severa l steps in the development of the pattern recognition software were done in order to understand and fully exploit the silicon tracker information, Thi s article gives an overview of the final algorithms and concepts of the tra ck reconstruction using the Silicon Tracker in DEL-PHI. (C) 2000 Elsevier S cience B.V, All rights reserved.