Residual stress and microstructures of aromatic polyimide with different imidization processes

Citation
T. Nishino et al., Residual stress and microstructures of aromatic polyimide with different imidization processes, POLYMER, 41(18), 2000, pp. 6913-6918
Citations number
20
Categorie Soggetti
Organic Chemistry/Polymer Science
Journal title
POLYMER
ISSN journal
00323861 → ACNP
Volume
41
Issue
18
Year of publication
2000
Pages
6913 - 6918
Database
ISI
SICI code
0032-3861(200008)41:18<6913:RSAMOA>2.0.ZU;2-D
Abstract
Processing of polyimide (PI) from precursor polyamic acid (PAA) solution in volves simultaneous imidization, evaporation of solvent and crystallization , so imidization process influences the final properties of PI. The residua l stress at the interface between the most popular PI (PMDA-ODA) and the al uminum substrate was measured by X-ray diffraction method and the relations hip between the microstructure and the mechanical properties was investigat ed for PI with different imidization processes. The residual stress and the mechanical properties of PI depend on the imidization process. The skeleta l structure is suggested to be changed by the amount of residual solvent du ring imidization process, which brings the difference in the residual stres s. (C) 2000 Elsevier Science Ltd. All rights reserved.