Reflection coefficient of a semiconductor superlattice subjected to a magnetic field

Propagation of magnetoplasma waves in a structure formed by periodically al ternating semiconductor and dielectric layers is studied for the case where an external magnetic field is applied parallel to the layers; the waves tr aveling in the plane normal to the field are considered. Dispersion charact eristics are calculated with the finiteness of the speed of light accounted for, and the features of the structure reflectivity are analyzed. It is de monstrated that the physical parameters and thicknesses of the layers compo sing the superlattice can be obtained from the frequency, angle of incidenc e, and magnetic-field dependences of the reflection coefficient. (C) 2000 M AIK "Nauka/Interperiodica".