Bv. Kamenev et al., Modification of optoelectronic properties of porous silicon produced in anelectrolyte based on heavy water, SEMICONDUCT, 34(6), 2000, pp. 728-731
The methods of infrared spectroscopy, electron spin resonance, and photolum
inescence were used to study the porous-silicon layers formed by electroche
mical treatment of Si in an HF : D2O solution. In contrast with the samples
prepared in a conventional electrolyte (HF : H2O), a steady increase in th
e photoluminescence intensity in the course of routine oxidation of the sam
ple was observed, with the hydrogen coverage of the silicon-skeleton surfac
e retained. A mechanism for anomalous oxidation of the layers of porous sil
icon obtained in a mixture of HF and heavy water is suggested. (C) 2000 MAI
K "Nauka/Interperiodica".