Photoinduced oxide film formation on n-type GaN surfaces using alkaline solutions

Citation
T. Rotter et al., Photoinduced oxide film formation on n-type GaN surfaces using alkaline solutions, APPL PHYS L, 76(26), 2000, pp. 3923-3925
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
26
Year of publication
2000
Pages
3923 - 3925
Database
ISI
SICI code
0003-6951(20000626)76:26<3923:POFFON>2.0.ZU;2-H
Abstract
We report on photoassisted wet chemical formation of thin oxide films on n- GaN layers in potassium hydroxide based electrolytes at room temperature. T he kinetics of the oxide formation and dissolution were examined via photoc urrent transients. The tendency of the photocurrent to level out during pho toelectrochemical etching experiments is associated with a quasiequilibrium state at the semiconductor/electrolyte interface. Homogeneous oxide films were grown in weak alkaline solutions (11 < pH < 13) under potentionstatic control with oxidation rates of up to 250 nm/h and characterized by Auger e lectron spectroscopy. Consequences on wet photochemical etch strategies are discussed. (C) 2000 American Institute of Physics. [S0003-6951(00)00826-3] .