The use of semiconductor materials as photocatalysts for cleaning gas proce
sses has received increasing interest in the last decade. In order to make
more active catalysts, it is worthwhile to investigate the main processes i
nfluencing photocatalytic reactions in more detail. One of these is the pro
cess of coadsorption of the reaction components on the catalyst surface und
er irradiation. It is shown that photoassisted NO adsorption can serve as a
model system in order to investigate the influence of irradiation intensit
y and temperature on the adsorption isotherm, respectively. This advantage
stems from the fact that NO is a radical, offering the possibility to stabi
lize electrons as well as holes on the TiO2 surface. This results in the fo
rmation of NO/NO pairs. The proposed adsorption model, however, does not on
ly consider this pair formation but, in addition, the adsorption of NO mole
cules on charged sites while the complementary charged sites are stabilized
by traps present on the surface. The proposed adsorption isotherm is suppo
rted by experimental results.