The true structure of hexagonal mesophase-templated silica films as revealed by X-ray scattering: Effects of thermal treatments and of nanoparticle seeding

Citation
M. Klotz et al., The true structure of hexagonal mesophase-templated silica films as revealed by X-ray scattering: Effects of thermal treatments and of nanoparticle seeding, CHEM MATER, 12(6), 2000, pp. 1721-1728
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
CHEMISTRY OF MATERIALS
ISSN journal
08974756 → ACNP
Volume
12
Issue
6
Year of publication
2000
Pages
1721 - 1728
Database
ISI
SICI code
0897-4756(200006)12:6<1721:TTSOHM>2.0.ZU;2-R
Abstract
This work describes the detailed structural investigation of mesophase-temp lated mesoporous silica films by 1D and 2D X-ray scattering techniques and transmission electron microscopy. The films are prepared by sol-gel dip coa ting with 2D hexagonal templating mesophases, yielding 2D mesoporous struct ures consisting of cylindrical pores whose axes are aligned parallel to the surface. It is shown that drying and thermal treatments induce an unidirec tional shrinkage of the layers in the direction of the normal of the film. The true rectangular symmetry is only evidenced by 2D X-ray scattering in t wo different scattering geometries. 1D diffraction gives only an apparent h exagonal symmetry. It is furthermore shown that although the cylinder axes are randomly orientated within the plane parallel to the surface, there are large domains with well aligned 2D planar unit cells perpendicular to the surface. It is demonstrated that this preferential ordering is destroyed by nanoparticle seeding with amorphous silica or maghemite particles.