Analysis of dielectric breakdown patterns in parallel-plate capacitors

Citation
Cr. Sheu et al., Analysis of dielectric breakdown patterns in parallel-plate capacitors, CHIN J PHYS, 38(3), 2000, pp. 461-470
Citations number
15
Categorie Soggetti
Physics
Journal title
CHINESE JOURNAL OF PHYSICS
ISSN journal
05779073 → ACNP
Volume
38
Issue
3
Year of publication
2000
Part
1
Pages
461 - 470
Database
ISI
SICI code
0577-9073(200006)38:3<461:AODBPI>2.0.ZU;2-Y
Abstract
The parallel-plate capacitor cells are used as model systems for studying t he dielectric breakdown (DB) patterns. Air, a liquid crystal and several ki nds of oils are used as the dielectric material sandwiched between the plat es. We study the types of patterns formed with different materials, voltage s and cell thickness. The fractal dimensions and the conditions for getting each type of DB pattern are obtained for the first time. In addition, the fractal dimensions of patterns simulated by using the active walker model ( AWM) are also analyzed and compared with the experimental DB patterns.