T. Horita et al., Oxygen chemical diffusion at LaMnO3 film/YSZ under cathodic polarization by secondary ion mass spectrometry, ELECTROCH, 68(6), 2000, pp. 433-438
Oxygen chemical diffusion at La0.92MnO3 film/YSZ interface was investigated
under cathodic polarized condition. Secondary ion mass spectrometry (SIMS)
analysis was performed for the samples with isotope oxygen exchange (O-16
/O-18 exchange at 1073 K). The diffusion profiles of O-18 in the La0.92MnO3
film showed that fast O-18 diffusion under cathodic polarization. The acti
ve sites for oxygen incorporation were distributed in many spots on YSZ sin
gle crystal surface from the SIMS imaging analysis. Also, Mn diffusion from
LaMnO3 to YSZ was observed in many spots on YSZ surface. Oxygen permeation
current density through the La0.92MnO3 film was calculated by the defect m
odel of LaMnO3 under cathodic polarization, which was a smaller than the ob
served value.