Oxygen chemical diffusion at LaMnO3 film/YSZ under cathodic polarization by secondary ion mass spectrometry

Citation
T. Horita et al., Oxygen chemical diffusion at LaMnO3 film/YSZ under cathodic polarization by secondary ion mass spectrometry, ELECTROCH, 68(6), 2000, pp. 433-438
Citations number
18
Categorie Soggetti
Physical Chemistry/Chemical Physics","Chemical Engineering
Journal title
ELECTROCHEMISTRY
ISSN journal
13443542 → ACNP
Volume
68
Issue
6
Year of publication
2000
Pages
433 - 438
Database
ISI
SICI code
1344-3542(200006)68:6<433:OCDALF>2.0.ZU;2-X
Abstract
Oxygen chemical diffusion at La0.92MnO3 film/YSZ interface was investigated under cathodic polarized condition. Secondary ion mass spectrometry (SIMS) analysis was performed for the samples with isotope oxygen exchange (O-16 /O-18 exchange at 1073 K). The diffusion profiles of O-18 in the La0.92MnO3 film showed that fast O-18 diffusion under cathodic polarization. The acti ve sites for oxygen incorporation were distributed in many spots on YSZ sin gle crystal surface from the SIMS imaging analysis. Also, Mn diffusion from LaMnO3 to YSZ was observed in many spots on YSZ surface. Oxygen permeation current density through the La0.92MnO3 film was calculated by the defect m odel of LaMnO3 under cathodic polarization, which was a smaller than the ob served value.