Mj. Bernhard et Sl. Simonich, Use of a bench-top photochemical reactor and solid-phase microextraction to measure semivolatile organic compound-hydroxyl radical rate constants, ENV TOX CH, 19(7), 2000, pp. 1705-1710
It is increasingly important to be able to measure semivolatile organic com
pound-hydroxyl (SOC-OH) radical rate constants and estimate semivolatile or
ganic compounds' (SOCs) atmospheric half-lives because of potential for atm
ospheric long-range transport. We have used a bench-top photochemical react
or, along with solid-phase microextraction (SPME) and ethyl nitrite, to suc
cessfully measure the rate constants of naphthalene, linalool, biphenyl, an
d phenanthrene with hydroxyl (OH) radical. Biphenyl and phenanthrene underw
ent wall loss in the reactor. The wall loss rates were determined and were
used to correct the measured gas-phase rate constants. The reaction rate co
nstants for naphthalene, linalool, biphenyl, and phenanthrene with OH radic
al, in our bench-top system at 295 +/- 3 K, were determined to be 2.73 +/-
0.37 x 10(-11), 1.93 +/- 0.24 x 10(-10), 7.44 +/- 1.9 x 10(-12), 1.73 +/- 0
.21 x 10(-11) (cm(3)/moleculels), respectively, and were in excellent agree
ment with previous studies and model predictions. Based on the range of exp
erimental and predicted rate constants for these reactants and an estimated
average OH concentration in the atmosphere, the atmospheric half-lives of
these SOCs are significantly less than 2 d. This indicates that the global
presence of these compounds in the atmosphere is primarily due to regional
sources and not to atmospheric long-range transport. This study shows that
bench-top reactors, combined with corrections for reactant wall loss and si
mplified analytical tools (such as solid-phase microextraction), can be use
d to measure SOC-OH rate constants.