For miniature interconnection applications, innovative material systems bas
ed on gallium alloys offer potentially attractive alternatives over commonl
y used bonding materials, such as solders and conductive adhesives, without
the reliability and environmental drawbacks. Gallium alloys are mechanical
ly alloyed mixtures of a liquid metal and metallic powders, formed at room
temperature. The alloys cure to form solid intermetallic compounds. In this
work, gallium alloys have been investigated for flip-chip interconnect app
lications. Specifically, this paper presents the results of a preliminary f
easibility study demonstrating gallium alloys as advanced interconnect mate
rials for flip-chip on laminate applications. The topics covered include th
e test vehicle assembly process, reliability screening results, preliminary
failure mode analysis, and interconnect microstructure analysis.
To demonstrate preliminary feasibility and application, gallium alloyed wit
h copper and nickel was used as micro-miniature interconnects between bare
silicon chips and printed circuit boards. This study shows preliminary feas
ibility of such interconnects and reliability tests demonstrate reasonable
cyclic fatigue with the use of underfill. Moreover, through the course of t
his work a new micro-deposition technology for gallium alloys was developed
which leverages existing industry infrastructure. This initial study repre
sents a significant advancement in microelectronic interconnect materials u
nveiling the potential for an innovative lead-free, low-temperature interco
nnect alternative.