M. Mayer et al., Integrated temperature microsensors for characterization and optimization of thermosonic ball bonding process, IEEE T COMP, 23(2), 2000, pp. 393-398
Citations number
22
Categorie Soggetti
Material Science & Engineering
Journal title
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES
A novel ball bond process optimization method based on the thermal response
of an integrated aluminum microsensor is reported. The in situ temperature
during ball bonding is measured and analyzed. The ultrasonic period shows
distinct stages corresponding to scrubbing of the ball on the pad, intermet
allic bond growth, and ball deformation by ultrasonic softening. A peak of
the signal indicates the end of interconnection growth. This can be used fo
r bond time optimization. When optimizing bonding force, the sensor signal
correlates with ball shear strength, Using this method, bonding force proce
ss windows can be determined by on-line measurements. A test measurement sh
ows that at a chip temperature of 34 degrees C, the bonding force optimized
by the microsensor method is 260 mN whereas it is 252 mN when using conven
tional shear testing for optimization. In summary, the method produces a we
alth of new insights in transient thermal phenomena of the ball bonding pro
cess and promises to simplify the evaluation of process windows.