Glitch power minimization by selective gate freezing

Citation
L. Benini et al., Glitch power minimization by selective gate freezing, IEEE VLSI, 8(3), 2000, pp. 287-298
Citations number
23
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
ISSN journal
10638210 → ACNP
Volume
8
Issue
3
Year of publication
2000
Pages
287 - 298
Database
ISI
SICI code
1063-8210(200006)8:3<287:GPMBSG>2.0.ZU;2-9
Abstract
This paper presents a technique for glitch power minimization in combinatio nal circuits. The total number of glitches is reduced by replacing some exi sting gates with functionally equivalent ones (called F-Gates) that can be "frozen" by asserting a control signal. A frozen gate cannot propagate glit ches to its output. Algorithms for gate selection and clustering that maxim ize the percentage of filtered glitches and reduce the overhead for generat ing the control signals are introduced. A power-efficient CMOS implementati on of F-Gates is also described. An important feature of the proposed metho d is that it can be applied in place directly to layout-level descriptions; therefore, it guarantees very predictable results and minimizes the impact of the transformation on circuit size and speed.