Cathodoluminescence characterization of defects in yttrium aluminum garnetdoped with Nd

Nominally undoped and Nd-doped yttrium aluminum garnet (YAG) crystals were studied by scanning electron microscopy, electron probe x-ray microanalysis , and cathodoluminescence (CL) microscopy and spectroscopy techniques. The detection limit of CL for Nd in YAG was found to be 10(-6) wt %. The nature of inhomogeneities in the crystals with a high Nd concentration was establ ished. The distribution of background Nd impurity over defect-rich YAG crys tals was assessed. A method for the identification of solid-phase inclusion s from x-ray microanalysis and CL data is proposed. The effect of the growt h technique and impurity concentration on the CL spectrum of YAG is examine d.